Course Outline: CA, San Francisco State University

By: Higher Education

Abstract: Physics 170: Advanced Laboratory Techniques

San Francisco State University
Physics 710
Fall 1997

Lecture Topics
[Material in square brackets is suggested reading]


    I. Data Analysis and Computer Techniques (3 weeks)
    [Etter (as needed); Handouts; Bevington, Chapters 1,2,3-3,4,5,6,7]

    • Statistics Review
    • Propagation of Errors
    • Graphical Analysis
    • Linearization
    • Comparison of Models to Data
      • Linear Least-Squares Fit
      • Uncertainities in Fit Parameters
      • Parameterized Linear Least Squares
      • Higher Order Least Squares
      • Chi-squared Criterion
    • Computer-Based Data Analysis
    II. Basic Laboratory Electronics and Instrumentation (2-3 weeks)
    [Dunlap Chap. 3; Moore, Davis, Coplan (MDC)]
    • Review of AC Signals and Circuits
    • Use of Standard Lab Instrumentation
    • Filters: Lowpass, Highpass, Bandpass
    • Op Amp Fundamentals
    • Op Amp Circuits
      • Amplifier
      • Current Source
      • Current/Voltage Converter
    • Basic Digital Circuits
    III. Electronic Signal Processing (2 weeks)
    [Class handouts; Dunlap Chap. 4]
    • Fundamental Noise Sources (Johnson Noise, Shot Noise, etc.)
    • Amplification of Weak Signals
      • Amplifier Noise
      • Amplifier Matching
      • Dynamic Range
      • Narrow-Band Amplifiers
      • Phase-Sensitive Detection
      • Signal Averaging
    • Spectral Analysis of Signals and Noise
    IV. Computer Interfacing & Experiment Control (2 weeks)
    [Handouts; Dunlap Chap. 4; Etter as needed; MDC]
    • Introduction to the IBM PC
    • Analog-Digital Conversion
    • Digital-Analog Conversion
    • Timing
    • Serial and Parallel Interfaces
    • IEEE Interfaces
    • Sampled Data Considerations: Aliasing, Resolution, ...
    • Software for Instrument Control and Data Acquisition
    V. Thermometry and Temperature Control (1 week)
    [Dunlap Chap. 6]
    • Temperature Sensors
    • Bridge Circuits for TEmp. Measurement
    • Temperature Control
    VI. Vacuum & Cryogenic Techniques (1 week)
    [Dunlap Chap. 5 & 7]
    • Pressure Measurement
    • Pumping Systems
    • Design of Vacuum Apparatus
    • Leak Detection
    • Cryogenic Apparatus Design
    VII. Nuclear Techniques & Safety (1 week)
    [Dunlap Chaps. 11, 12]
    • Review of Radioactivity
    • Safety Issues
    • Particle Detectors
    • Nuclear Instrumentation
    VIII. Magnetic Techniques (1 week)
    • [Dunlap Chap. 14]
    • Magnetic detectors
    • Field sources
    • Magnetic Shielding
    IX. Optical Techniques (1 week)
    [Dunlap Chap. 8,9,10]
    • Optical Sources
    • Optical Components
    • Optical Detectors
    X. Experiment Design; Apparatus Design & Fabrication (1 week)
    [Class handouts; MDC]
    • Mechanical Drawing
    • Machine Tool Concepts
    • Joining Methods
    • Electronic Fabrication Techniques



Server Response from: ETNASC04